Measuring Magnetic Fields When performing a magnetic particle inspection, it is very important to be able to determine the direction and intensity of the magnetic field. As discussed previously, the direction of the magnetic field should be between 45 and 90 degrees to the longest dimension of the flaw for best detectability. The field intensity must be high enough to cause an indication to form, but not too high to cause nonrelevant indications to mask relevant indications. To cause an indication to form, the field strength in the object must produce a flux leakage field that is strong enough to hold the magnetic particles in place over a discontinuity. Flux measurement devices can provide important information about the field strength. Since it is impractical to measure the actual field strength within the material, all the devices measure the magnetic field that is outside of the material. There are a number of different devices that can be used to detect and measure an external magnetic field. The two devices commonly used in magnetic particle inspection are the field indicator and the Hall-effect meter, which is also called a gauss meter. Pie gauges and shims are devices that are often used to provide an indication of the field direction and strength but do not actually yield a quantitative measure. They will be discussed in a later section. Field Indicators
A field indicator is shown checking for residual magnetism in this movie. (194 MB mov)
Hall-Effect (Gauss/Tesla) Meter
The voltage generated Vh can be related to the external magnetic field by the following equation. Vh = I B Rh / b
Where: Probes are available with either tangential (transverse) or axial sensing elements. Probes can be purchased in a wide variety of sizes and configurations and with different measurement ranges. The probe is placed in the magnetic field such that the magnetic lines of force intersect the major dimensions of the sensing element at a right angle. Placement and orientation of the probe is very important and will be discussed in a later section. |
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